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SN74BCT8244ANTG4

SN74BCT8244ANTG4

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制造商部分
SN74BCT8244ANTG4
制造商
Texas Instruments
描述
IC SCAN TEST DEVICE BUFF 24-DIP
类别
集成电路
家庭
逻辑 - 专业逻辑
系列
-
有存货
1487
在线数据表
-
询问

Product Specifications

Type 描述
系列:74BCT
包裹:Tube
零件状态:Obsolete
逻辑类型:Scan Test Device with Buffers
电源电压:4.5V ~ 5.5V
位数:8
工作温度:0°C ~ 70°C
安装类型:Through Hole
包/箱:24-DIP (0.300", 7.62mm)
供应商设备包:24-PDIP

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