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SN74BCT8374ADW

SN74BCT8374ADW

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制造商部分
SN74BCT8374ADW
制造商
Texas Instruments
描述
IC SCAN TEST DEVICE W/FF 24-SOIC
类别
集成电路
家庭
逻辑 - 专业逻辑
系列
-
有存货
75
在线数据表
-
询问

Product Specifications

Type 描述
系列:74BCT
包裹:Tube
零件状态:Active
逻辑类型:Scan Test Device with D-Type Edge-Triggered Flip-Flops
电源电压:4.5V ~ 5.5V
位数:8
工作温度:0°C ~ 70°C
安装类型:Surface Mount
包/箱:24-SOIC (0.295", 7.50mm Width)
供应商设备包:24-SOIC

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