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SN74ABT8245DWR

SN74ABT8245DWR

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制造商部分
SN74ABT8245DWR
制造商
Texas Instruments
描述
IC SCAN TEST DEV W/OBT 24-SOIC
类别
集成电路
家庭
逻辑 - 专业逻辑
系列
-
有存货
9622
在线数据表
-
询问

Product Specifications

Type 描述
系列:74ABT
包裹:Tape & Reel (TR)Cut Tape (CT)
零件状态:Active
逻辑类型:Scan Test Device with Bus Transceivers
电源电压:4.5V ~ 5.5V
位数:8
工作温度:-40°C ~ 85°C
安装类型:Surface Mount
包/箱:24-SOIC (0.295", 7.50mm Width)
供应商设备包:24-SOIC

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